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Опубликовано
2015-10-11
Опубликовано на SciPeople2015-11-28 23:27:43
ЖурналAdvanced Studies in Theoretical Physics
Measurement of Electroconductivity of Anisotropic Semiconductors by Van der Pauw Method Part 2. Contacts Location in the Corners of the Lateral Plane of the Sample
Vol. 9, 2015, no. 14, pp. 693 - 699
Аннотация
In this work on the basis of a mathematical model an original method how to
measure tensor component of specific conductivity is theoretically grounded for
square anisotropic semiconductor plates. The type with current and measurement
contacts being located at the corner of lateral plane of the sample is considered.
The appliance of contact stippling has been estimated. The suggested method has
been experimentally tested.
http://www.m-hikari.com/astp/astp2015/astp13-16-2015/5993.html
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