NATURE OF WORK: Applicants are sought for a postdoctoral position, in which synchrotron-based x-ray microscopy will be used to study how strain effects the properties of semiconductor thin films. The successful scientist will join an international team of materials scientists, engineers, synchrotron scientists and industrial partners, engaged in the fabrication and characterization of semiconductor materials.
Your role will be in the development and application of polarized x-ray microscopy for mapping strain in semiconductor materials. This research will be performed at the Canadian Light Source (www.lightsource.ca), located on the University of Saskatchewan campus, under the supervision of Professor Stephen Urquhart.
The starting date will be as mutually agreed, and applications will be accepted until the position is filled.
QUALIFICATIONS
Education: A Ph.D. degree in Chemistry, Physics or a related discipline, pending or obtained within the past four years.
Experience: Previous experience with instrumentation and optical/electron spectroscopy is required for this position. In particular, experience in performing x-ray absorption spectroscopy, x-ray or electron experiments is beneficial. Familiarity with surface and UHV technology and working effectively in a synchrotron environment are useful assets.
APPLICATION PROCEDURE:
Send your curriculum vita, along with names and contact information of three references to the following email address: xrm.pdf[ at ]usask.ca
In your cover letter or email, please outline your experience with the development, use or analysis of spectroscopy and microscopy methods beyond the routine use of standard methods.
Link: www.lightsource.ca),
Country: Canada
