Опубликовано
2007-11-14
На SciPeople2009-07-02
ЖурналProceedings of the Sixth International Conference on the Computer-aided design of discrete devices (CAD DD'2007)
Hybrid symbolic-genetic approach to test pattern generation for digital logic circuits
A genetic tests synthesis algorithm for the synchronous digital circuits, based on solving the integer optimization problem with a scalar objective function is presented. A decomposition strategy of the circuit under test and symbolic representation of its fragments obtained. New objective function with a global optimum which is the test sequence developed. Experimental results confirmed the effectiveness and practical applicability of the method.
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